Abstract :

The processes of silver diffusion into thin-film structures (As2S3)0,995Sn0,005 under the X-ray radiation were studied. Thin-film layers of silver, about 12 nm thick, were deposited by vacuum thermal evaporation on the (As2S3)0,995Sn0,005 surface. The thin layer structures were irradiated with X-ray radiation in the range of absorbed doses of 0,3-0,6 Gy using the X-ray tube with a copper anode (voltage 45 kV, current 40 mA) as an X-ray source without any filters (the continuous spectrum of X-ray, or “white” spectrum). The possibility of X-ray images recording with their subsequent visualization using the chemical etching in a 5% solution of NaOH is shown.

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Keywords :

Chalcogenide Glassy Semiconductors, Diffusion Of Metals, X-Ray Imaging

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